搜索结果: 1-7 共查到“电子科学与技术 presence”相关记录7条 . 查询时间(0.031 秒)
Configuration of VLSI Arrays in the Presence of Defects
Circuit area fault tolerance percolation theory probabilistic analysis queuing processes systolic arrays
2015/8/14
The penalties for configuring VLSI arrays for yield enhancement are assessed. Each dement of the fabricated array is assumed to be defective with independent probability p. A fixed fractmn R of the el...
Configuration of VLSI Arrays in the Presence of Defects
Circuit area fault tolerance percolation theory probabilistic analysis queuing processes systolic arrays wafer-scale integration wire length
2015/8/12
The penalties for configuring VLSI arrays for yield enhancement are assessed. Each dement of the fabricated array is assumed to be defective with independent probability p. A fixed fractmn R of the el...
Self-tuning for maximized lifetime energy-efficiency in the presence of circuit aging
Integration framework optimizing control strategy of dynamic control self-tuning parameters circuit aging supply voltage
2015/8/7
This paper presents an integrated framework, together with control policies, for optimizing dynamic control of self-tuning parameters of a digital system over its lifetime in the presence of circuit a...
Analysis and Optimization of Mobile Phone Antenna Radiation Performance in the Presence of Head and Hand Phantoms
Numerical simulation hand phantom antenna design
2009/7/28
A commercial clam shell phone CAD model is used to numerically investigate the effect of a hand phantom on mobile phone antenna radiation performance. The simulation results show that the grip of the ...
Detection of Action Potentials in the Presence of Noise Using Phase-Space Techniques
Action potential detection Low SNR, Phase space diagrams/trajectories Unsupervised/no-prior knowledge
2010/2/2
Emerging Bio-engineering fields such as Brain
Computer Interfaces, neuroprothesis devices and modeling and
simulation of neural networks have led to increased research activity
in algorithms for th...
Titanium Silicide Formation in Presence of Oxygen
Titanium Silicide rf Sputtering Resistivity vs. Temperature Rutherford Backscattering Spectrometry Auger Spectroscopy X-Ray Diffraction
2010/12/16
In-situ resistivity vs. temperature, Rutherford backscattering spectrometry, Auger electron spectroscopy and X-ray diffraction measurements have been performed in order to study the effects arising fr...
A 22% Efficient Semiconductor/Liquid Junction Solar Cell—the Photoelectrochemical Behavior of n-WSe2 Electrodes in the Presence of I2/I- in Aqueous Electrolyte
Aqueous Electrolyte n-WSe2 Electrodes the Photoelectrochemical Behavior Semiconductor/Liquid Junction Solar Cell
2010/12/21
One of the most efficient semiconductor/liquid-junction photoelectrochemical cells (PEC) reported to date is presented. It consists of a SeCl4-grown n-WSe2 single crystal anode, with a 3.1016 cm-3 con...