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Configuration of VLSI Arrays in the Presence of Defects
Circuit area fault tolerance percolation theory probabilistic analysis queuing processes systolic arrays
2015/8/14
The penalties for configuring VLSI arrays for yield enhancement are assessed. Each dement of the fabricated array is assumed to be defective with independent probability p. A fixed fractmn R of the el...
Configuration of VLSI Arrays in the Presence of Defects
Circuit area fault tolerance percolation theory probabilistic analysis queuing processes systolic arrays wafer-scale integration wire length
2015/8/12
The penalties for configuring VLSI arrays for yield enhancement are assessed. Each dement of the fabricated array is assumed to be defective with independent probability p. A fixed fractmn R of the el...
Open-Circuit End Effect of Microstrip Line Configuration in Plasma Medium
Open-Circuit End Microstrip Line Configuration Plasma Medium
2010/12/10
The extension in length for open microstrip configuration in plasma media is determined using spectral domain technique under quasi static approach [1, 2]. The results were verified by modifying Hamme...