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Development of Duallight Path Monitoring System of Optical Thinfilm Thickness
optical engineering monitoring thinfilm thickness duallight path duallockphase circuit
2008/6/30
The accurate monitoring of optical thinfilm thickness is a key technique for depositing optical thinfilm. For existing coating equipments, which are low precision and automation level on monitoring ...
Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method
ellipsometry passivation CdTe films
2011/5/6
Ellipsometric detective method of refractive index, absorptive index and thickness of the film deposited on the substrate with some optical parameters has been developed. This method is applied for op...