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Scientists set traps for atoms with single-particle precision
Scientists set traps atoms with single-particle precision
2016/11/29
Atoms, photons, and other quantum particles are often capricious and finicky by nature; very rarely at a standstill, they often collide with others of their kind. But if such particles can be individu...
武汉理工大学船舶辅机课件Chapter4 PIPING, VALVES & STEAM TRAPS
武汉理工大学 船舶辅机 课件 Chapter4 PIPING VALVES STEAM TRAPS
2014/7/16
武汉理工大学船舶辅机课件Chapter4 PIPING, VALVES & STEAM TRAPS。
Development of Chloride Traps Containing Zinc Oxide for Continuous Catalyst Regeneration Type Catalytic Reforming Process
Continuous catalytic regeneration Catalytic reforming Chloride trap
2009/7/28
Net hydrogen off-gas from the continuous catalyst regeneration type catalytic reforming process (CCR process) contains inorganic chlorides. In order to prevent potential problems such as corrosion in...
Exploration case study of sandstone pinch-out stratigraphic traps offshore Kitakanbara—Challenge to discovery of “the second Iwafuneoki oil and gas field”
sandstone pinch-out stratigraphic trap offshore Kitakanbara Niigata 3D seismic seismic facies
2009/4/2
Integrated geological and geophysical study was carried out using newly acquired 3D seismic data in order to evaluate further exploration potential for sandstone pinch-out traps, offshore Kitakanbara,...
Influence of surface states and bulk traps on non-equilibrium phenomena at GaAs and GaN surfaces
gallium arsenide gallium nitride surface states bulk traps
2011/4/27
The influence of surface state density NSS and bulk non-radiative lifetime t on room temperature photoluminescence quantum efficiency YPL and surface photovoltage (SPV) versus the excitation light int...
Characterization of Defect Traps in SiO2 Thin Films
Gate oxide MOS capacitor C-V characteristics Hysteresis Slow-state traps
2010/12/8
In order to understand the degradation of the electrical operations of metal-oxide-semiconductor (MOS) devices, this work is concerned by the defects generation processes in the non-stoichiometric SiO...