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Study of Emission Parameters of Ir(III)-Ba Film System
Emission Parameters Ir(III)-Ba Film System
2010/4/19
Electrophysical properties of Ir(III)-Ba metal-film system have been studied by thermoionic emission (TE), surface ionization (SI) and thermal desorption spectroscopy (TDS) methods. It has been found ...
The Determination of Thermal Annealing Effect on the DOS Profile of a-Si:H Film
Thermal Annealing Effect DOS Profile a-Si:H Film
2010/4/19
In this study the aim was to investigate the effect of thermal annealing on the density of states (DOS) of hydrogenated amorphous silicon (a-Si:H) by means of a Schottky structure. In order to realize...