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Interface Trap Density Metrology of state-of-the-art undoped Si n-FinFETs
Interface Trap Density Metrology state-of-the-art undoped Si n-FinFETs
2010/11/22
The presence of interface states at the MOS interface is a well-known cause of device gradation.This is particularly true for ultra-scaled FinFET geometries where the presence of a few traps can stron...
A new complementary relation between classical bits and randomness in local part in simulating singlet state
complementary relation classical bits randomness simulating singlet state
2010/10/21
Recently Leggett’s proposal of non-local model generates new interest in simulating the statistics of singlet state. Singlet state statistics can be simulated by 1 bit of classical communication witho...
Wigner Distribution Function and Husimi Function
of a Kind of Squeezed Coherent State
Wigner function Husimi function squeezed coherent state IWOP technique
2007/8/15
2007Vol.47No.3pp.427-430DOI:
Wigner Distribution Function and Husimi Function
of a Kind of Squeezed Coherent State
FAN Hong-Yi and LIU Shu-Guang
Department of Materials ...